Semiconductor & Solar >> Four Dimensions Inc., USA

Four Point + Cvmap

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    Features:

    Combined C-V, I-V and four point probe mapping system
    all features of M4PP3093 and CVmap 3093 A/B combined
    Suited for the characterization of USJ

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      Detailed Specs

      Features of M4PP3093:

      Desktop system with computer control
      Up to 300 mm (12″”) capability
      6 mm edge exclusion

      Features for CVmap 3093 A/B

      same basic features as CVmap 92 A/B
      up to 300 mm (12″”) capability
      Desktop system
      Drawer for receiving the wafer
      CVmap software