Semiconductor & Solar >> Kleindiek Nanotechnik GmbH

Micro & Nano probing System

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    ProbeWorkstation – The powerful, dedicated Micro and Nano probing system for electrical characterization of semiconductor devices and advanced materials inside Scaning Electron Microscope and FIB.

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      The optimal combination of our market-leading micro and nano manipulation and probing products provide you with a versatile, integrated solution for failure analysis and R&D applications requiring stable, low-current measurements.
      The system is optimized for electrical measurements on semiconductor technologies down to 22 nm and beyond. It offers unsurpassed stability, extreme precision, and the flexibility to allow you to configure your setup to meet your specific needs.
      Compatible with most of the Scanning Electron Microscopes and FIBs available in the market such as,
      Carl Zeiss, FEI, Tescan, Jeol, Hitachi, Olympus, etc.